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Microscopy of Semiconducting Materials 1987, Proceedings of the Institute of Physics Conference, Oxford University, April 1987
 

Microscopy of Semiconducting Materials 1987, Proceedings of the Institute of Physics Conference, Oxford University, April 1987 (Hardback)

By Cullis
Volume editor Augustus, P. D.

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The various forms of microscopy and related microanalytical techniques are making unique contributions to semiconductor research and development that underpin many important areas of microelectronics technology. Microscopy of Semiconducting Materials 1987 highlights the progress ...that is being made in semiconductor microscopy, primarily in electron probe methods as well as in light optical and ion scattering techniques. The book covers the state of the art, with sections on high resolution microscopy, epitaxial layers, quantum wells and superlattices, bulk gallium arsenide and other compounds, properties of dislocations, device silicon and dielectric structures, silicides and contacts, device testing, x-ray techniques, microanalysis, and advanced scanning microscopy techniques. Contributed by numerous international experts, this volume will be an indispensable guide to recent developments in semiconductor microscopy for all those who work in the field of semiconducting materials and research development.
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ISBN 9780854981786
Released NZ 1 Oct 1987
Publisher Taylor & Francis
Format Hardback
Series Conference (part: No. 87)
Availability
Indent title (internationally sourced), allow 8-12 weeks

Full details for this title

ISBN-13 9780854981786
Stock Available
Status Indent title (internationally sourced), allow 8-12 weeks
Publisher Taylor & Francis
Imprint CRC Press
Released 1 Oct 1987
Publication Country United Kingdom United Kingdom
Format Hardback
Author(s) By Cullis
Volume editor Augustus, P. D.
Series Conference (part: No. 87)
Category Non-Fiction (Child / Teen)
Chemical Spectroscopy, Spectrochemistry
Materials Science
Electrical Engineering
Number of Pages 820
Dimensions Width: 174mm
Height: 246mm
Spine: 42mm
Dewey Code 537.622
Weight 1,474g
Interest Age 19+ years
Reading Age 19+ years
Library of Congress Semiconductors - Congresses, Electron microscopy - Congresses
NBS Text Chemistry
ONIX Text College/higher education;Professional and scholarly

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